Fluorescent X-ray Analyzer "X-RAY XAN250/XAN252"
Ideal for the analysis of thin films and trace elements! Non-destructive analysis of precious metal composition and plating thickness measurement is possible.
The "FISCHERSCOPE(R) X-RAY XAN(R)250/XAN(R)252" is an energy-dispersive fluorescent X-ray analyzer. It allows for non-destructive composition analysis of precious metals and measurement of plating thickness. It is particularly suitable for the analysis of thin films and trace elements. The XAN250 and XAN252 differ in measurement stage and housing size. The "XAN250" is a fixed stage type, while the "XAN252" features a manual XY stage type with a large safety hood. The main measurement targets include thin film measurements in the nanometer range (related to electronics and semiconductors), analysis of regulated substances (such as lead in toys), and high-precision analyses (jewelry, watches, precious metals), as well as applications in universities and research institutions. 【Features】 - Automatically sets the optimal irradiation area and filter for each measurement specification. - The latest silicon drift detector exhibits high precision and detection capability. - Excellent accuracy and long-term stability. → Saves time and effort required for recalibration. - Fischer's FP method allows for theoretical calculations of film thickness analysis, regardless of whether the sample is solid or liquid. For more details, please contact us or download the catalog.
- Company：東栄産業
- Price：Other
